Equipment List

Grouping Item Description Manufacturer Model Number Serial No Description and use Equipment limits including ranges Accuracy Frequency of calibration 
environmental 9 Temp Humidity Chamber Thermotron 2800 31997 conditioning and stressing samples for specific tests -87C to +190.6C. 5 to 100% R.H ±2°C and ±1 % R.H. 1 year
environmental 18 Perkin Elmer Perkin Elmer DMA/7E   used for TG, ΔTg and T260/T288 testing RT to 450° ± 1°C 6 months
environmental 29 ISO Temp Oven Precision Oven 25EG 601031161 preconditoning of samples prior to testing RT to 200°C ±2°C  1 year
hand tool 2 Digital Caliper Mitutoyo Mitutoyo CD-6-CS 218107 dimensional measurement of samples  0-150 mm or 0-6 inches 0.0005" 2 years
hand tool 5 Micrometer Mitutoyo Mitutoyo   193-211 dimensional measurement of samples  0-1" ±0.0001" 1 year
hand tool 7 Scale Denver Instument Co Denver Instuments TR-203 T0116255 accratley weighing lab solutions including etchants and potting compounds 0 to 210 grams ± of applied load 1 year
hand tool 8 Peel Tester Shimpo MF Shimpo 22159 performing copper peel testing of laminate 0-2 punds force ±0.1 lbf 2 years
hand tool 10 Digital Height Gauge Photocircuits D5VA   dimensional measurement of samples  0 to 230 mils ±0.005"  1 year
hand tool 11 Digital Caliper Mitutoyo Mitutoyo CD-6-CS 237183 dimensional measurement of samples  0-150 mm or 0-6 inches ±0.0005" 2 years
hand tool 22 Pin Gage Meyer M-1 .061/.25   hole diameter measurement 0.61 to 0.132" ±0.005" 1 year
hand tool 23 Pin Gage Meyer .22/1.50 M0MM501 hole diameter measurement 0.22 to 1.50 mm ± 0.01 mm 1 year
hand tool 24 Pin gage Meyer .011/.060 M0*06/14 hole diameter measurement 0.11 to 0.60 " ±0.005" 1 year
hand tool 38 digital thermometer Fluk Mfg CNXt3000 27030032 temperature measurement neg 200°to 1372°C ±(0.5%+0.3°C) counts 1 year
meter 1 MegohmMeter / IR Tester QuadTech 1865 QuadTech 1865 298951 meaurement of insulation resistance of test coupons 1E+4 ohms to 3.96 E+15 ohms resistance value dependent (available upon request) 1 year
meter 3 Multimeter Fluk Mfg 25 multimeter 5715027 measurement of volts and continuity 0 to 1000  volts/ 0- 32Mohms resistance value dependent (available upon request) 1 year
meter 20 LCR Meter Gwinstek EL 190622 EL190622 measurement of capacitance and resistance 0.00001pF to 999µF. 0.00001Ω to 999KΩ  ± 0.5% 1 year
meter 21 OHM Meter Keithly 580 micro ohm meter 0591387 4 probe resistance measurement  200mΩ to 200KΩ ± 0.5% 1 year
meter 26 Dielectric Strength Tester Criterion Criterion Instruments LTD 6773 measurement of dielectric break down of laminate 0 to 2750 AC volts  10 volts 1 year
meter 28 Fischer Scope XRF Fischer XDal 237 110007453 non destructive measurement of plating thickness and composition 0.3 mils to 2 mils ± 5% 1 year
ref std 4 Starrett Gauge Block Grade 2 Starrett   90710 used for low mag micrscope measurement calibration 0.020 to 12 inches ASME.B89.1.9 2 years
ref std 16 Granite Surface Plate Starrett 18X24X3 OLB 70651 reference plane for measurements n/a 0.00015 TIR 2 year
ref std 17 Optical Micrometer Unitron 0.001in Unitron A01101-104 calibrate inverted microscopes  0 to 40 mils ±0.0002" 1 year
ref std 25 Troemner Weight Troemner   08393 calibration of the wetting balances 100mg to 4 grams ± 1% 2 years
scope 12 Zeiss Inverted microscope Zeiss Axiovert 25 666103 inspection of previously potted cross sections 50X to 1000X 0.15 thou @25X to 0.01 thou at 1000X 6 months
scope 13 Measurment System Buehler Omnimet Buehler Omnimet   image capture and mesurement software 10 microinches to 150 mils 0.15 thou @25X to 0.01 thou at 1000X 6 months
scope 14 Nikon Stereo Scope Nikon SMZ800 540422 inspection of non  potted samples 0.63X to 63X (with option for 1.26X to 126X) 0.47 thou@ 10X to 0.09 thou at 63X 6 months
scope 15 Zeiss Inverted microscope Zeiss Axi Observer A1 3832001180 inspection of previously potted cross sections 25X to 1000X 0.15 thou @25X to 0.01 thou at 1000X 6 months
scope 27 Nikon Stereo Scope  Nikon SMZ 1000 8E00198 inspection of non  potted samples 8X to 80X (with option for 16X to 160X) 0.15 thou @ 8X to 0.06 thou at 80X 6 months
solderability testing 6 Wetting Balance Menisco ST50 Metronelec ST50 521 wetting force and angle measurement of solderable surfaces and devices -50 to +50 mN/mm 0.01mN 1 year
solderability testing 19 Wetting Balance Menisco ST 88 Metronelec ST 88 ST-88 wetting force and angle measurement of solderable surfaces and devices -50 to +50 mN/mm 0.01 mN 1 year
scope 92 Olympus Confocal microscope Olympus Lext   non contact surface morphology measurement     1 year
solderability testing 31 SAT Steam Age Controller Mountaingate Engineering Inc µSAT 89020-1-01 preconditoning of samples prior to testing RT to 100°C ±2°C  1 year
scope  93 Zeiss Upright scope  Zeiss Axotron 2   inspection of previously potted cross sections 25X to 2000X 0.15 thou @25X to 0.01 thou at 1000X 1 year
scope 106 Nikon stereo scope Nikon SMZ-U   inprocess inspection of cross sections 7.5X to 75X no measurement capability  1 year
scope   scanning electron microscope Hitachi 2460N   failure analysis 40X to 200000X magnification dependent   
scope   scanning electron microscope Zeiss EVO50   failure analysis 18X to 1000000X magnification dependent  1 year
scope   EDS  Bruker X-flash   failure analysis elements > Boron element dependent each use
grinder   semi automated cross section grinder allied Metprep4 PH6   cross section preparation 1 1/8 and 1 1/2" mounts no measurement capability  n/a
polisher    semi automated cross section grinder allied Metprep4 PH6   cross section preparation 1 1/8 and 1 1/2" mounts no measurement capability   
grinder/ polisher   precison decapsulation equipment  allied multiprep   planar decpapsulation of devices all current electronic devices 1 micron  n/a