The majority of work conducted by STand S Group consists of cross sectional analysis either for failure analysis, reverse engineering, product evaluation or product validation. All our cross sections are made to reference standard quality, i.e. scratch free, edge retention, over-plated when necessary and to the correct area of interest. Evaluation of the cross section by bright field/ dark field or DIC (Differential interference contrast) as necessary to obtain best image for analysis. Magnification from 25X to 1000X. We have a large range of specific etchants for image enhancement and contrast. Mounts in acrylic or epoxy.
(FIG.2) 50X of the first via from the failed device with the remains of the broken drill bit in the hole and plated over.
(FIG.1) 200X of the top half of the broken drill bit – note the copper plated over it.