S T and S utilizes Fischer Technologies XRF equipment for plating thickness measurements. Our current standard XRF is an XDAL-SDD. 

All existing product files are calibrated and verified using NIST traceable standards prior to every measurement request. 

Total expanded uncertainty values for the thickness values are provided to help ensure acceptance or rejection consideration of sample lot.

Where product files do not exist, S T and S utilizes its relationship with Fischer Technologies to ensure that the correct product file is created for the specific application. Where applicable, NIST traceable standards for non-common metals can be obtained to ensure accuracy and traceability of measurement  results.

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S T and S was instrumental in the creation of the IPC TM-650 2.3.44 determination of Thickness and Phosphorus Content in Electroless Nickel (EN) Layers by X-Ray Fluorescence (XRF) Spectrometry